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Volumn 80, Issue 1-4, 1998, Pages 241-245
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Substrate temperature dependence of the photoluminescence efficiency of co-sputtered Si/SiO2 layers
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Author keywords
Infrared absorption; Magnetron sputtering; Photoluminescence; Raman scattering; Si SiO2 layer; Silicon nanograin; X ray photoelectron spectroscopy
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Indexed keywords
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EID: 0001409896
PISSN: 00222313
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-2313(98)00105-7 Document Type: Article |
Times cited : (26)
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References (13)
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