Comparison of statistical enhancement methods for Monte Carlo semiconductor simulation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 17, Issue 12, 1998, Pages 1230-1235

  Wordelman, Carl J ^a   Kwan, Thomas J T ^a   Snell, Charles M ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Monte carlo; Statistical enhancement; Variance reduction

Indexed keywords

EID: 0001379772     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.736562     Document Type: Article

References (18)

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