A multicomb variance reduction scheme for Monte Carlo semiconductor simulators

IEEE Transactions on Electron Devices

Volumn 45, Issue 4, 1998, Pages 918-924

  Gray, M G ^a   Booth, T E ^a   Kwan, T J T ^a   Snell, C M ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Importance sampling; Monte Carlo device simulation; particle comb; population control; variance reduction

Indexed keywords

HOT ELECTRON EFFECTS; MICRO-ELECTRONIC DEVICES; MONTE CARLO DEVICE SIMULATIONS; POPULATION CONTROL; STATISTICAL VARIANCE; TWO DIMENSIONAL (2 D); VARIANCE REDUCTION TECHNIQUES; VARIANCE REDUCTIONS;

HOT ELECTRONS; IMPORTANCE SAMPLING;

MONTE CARLO METHODS;

EID: 0001210373     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.662803     Document Type: Article

References (13)

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