Phase field model of surface electromigration in single crystal metal thin films

Physica D: Nonlinear Phenomena

Volumn 126, Issue 3-4, 1999, Pages 201-213

  Mahadevan, Mohan ^a   Bradley, R Mark ^a  

^a Department of Ecosystem Science and Sustainability   (United States)

Author keywords

05.70.Ln; 66.30.Qa; 68.35.Fx; 68.35.Ja; Asymptotic analysis; Electromigration; Moving boundary problems; Phase field

Indexed keywords

BOUNDARY VALUE PROBLEMS; ELECTRIC PROPERTIES; ELECTROMIGRATION; INTERFACES (MATERIALS); LAPLACE TRANSFORMS; MATHEMATICAL MODELS; PARTIAL DIFFERENTIAL EQUATIONS; SINGLE CRYSTALS; SURFACE PHENOMENA;

ASYMPTOTIC ANALYSIS; LAPLACE EQUATIONS; METAL VOID INTERFACE; PHASE FIELD MODEL; SURFACE ELECTROMIGRATION;

METALLIC FILMS;

EID: 0033075096     PISSN: 01672789     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2789(98)00276-0     Document Type: Article

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