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Volumn 118, Issue 5-6, 2000, Pages 287-296

Aluminum Single Electron Transistors with Islands Isolated from the Substrate

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001280707     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1004625530034     Document Type: Article
Times cited : (47)

References (19)
  • 2
    • 85177109015 scopus 로고
    • Ph.D. thesis, Delft University of Technology
    • S. M. Verbrugh, Ph.D. thesis, Delft University of Technology, 1995; S. M. Verbrugh, M. L. Benhamadi, E. H. Visscher, and J. E. Mooij, J. Appl. Phys. 78, 2830 (1995).
    • (1995)
    • Verbrugh, S.M.1
  • 10
    • 0000924052 scopus 로고
    • J. Niemeyer, PTB Mitt. 84, 251 (1974); G. J. Dolan, Appl. Phys. Lett. 31, 337 (1977).
    • (1974) PTB Mitt. , vol.84 , pp. 251
    • Niemeyer, J.1
  • 11
    • 21544444472 scopus 로고
    • J. Niemeyer, PTB Mitt. 84, 251 (1974); G. J. Dolan, Appl. Phys. Lett. 31, 337 (1977).
    • (1977) Appl. Phys. Lett. , vol.31 , pp. 337
    • Dolan, G.J.1
  • 13
    • 24844481395 scopus 로고    scopus 로고
    • to be published
    • V. A. Krupenin, D. E. Presnov, A. B. Zorin, and J. Niemeyer, in 22nd International Conference on Low Temperature Physics (Helsinki, Finland, 1999); to be published in Physica B; http://lt22.hut.fi/cgi/view?id=S11138
    • Physica B
  • 17
    • 0041443755 scopus 로고    scopus 로고
    • We characterize the sensitivity of our devices in terms of equivalent charge noise referred to the transistor island
    • We characterize the sensitivity of our devices in terms of equivalent charge noise referred to the transistor island.


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