Charge state instabilities in the single-electron trap

Czechoslovak Journal of Physics

Volumn 46, Issue SUPPL. 4, 1996, Pages 2283-2284

  Krupenin, V A ^a   Lotkhov, S V ^a,b   Presnov, D E ^a   Zorin, A B ^a,b   Ahlers, F J ^b   Niemeyer, J ^b   Scherer, H ^b   Weimann, T ^b   Wolf, H ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22044444942     PISSN: 00114626     EISSN: 15729486     Source Type: Journal    
DOI: 10.1007/BF02571133     Document Type: Article

References (8)

1. P. Lafarge et al., C.R. Acad. Sci. Paris 314 Ser. II (1992) 883.
2. K. Nakazato et al., J. Appl. Phys. 75, (1994) 5123.
3. J.E. Lukens et al., Physica B 203, (1994) 354.
4. V.A. Krupenin, S.V. Lotkhov, D.E. Presnov, in preparation.
5. D.V. Averin and A.A. Odintsov, Phys. Lett. A 140, (1989) 251.
6. V.A. Krupenin, S.V. Lotkhov, D.E. Presnov, in: "Nanostructures: physics and technology". Abstracts of Invited Lectures and Contributed Papers, St.Petersburg. Russia, 26-30 June 1995, 354-356.
7. A.B. Zorin et al., in this issue.
8. F.-J. Ahlers et al., subm. to CPEM (Braunschweig, Germany, June 17-20, 1995).