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Applied Physics Letters

Volumn 73, Issue 23, 1998, Pages 3438-3440

Correlation between the surface defect distribution and minority carrier transport properties in GaN

(4) Bridger, P M a Bandic Z Z a Piquette, E C a McGill, T C a

a California Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001257023 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.122790 Document Type: Article

Times cited : (31)

References (15)

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