Thermal-wave measurement of thin-film thermal diffusivity with different laser beam configurations

Review of Scientific Instruments

Volumn 67, Issue 6, 1996, Pages 2312-2316

  Yu, X Y ^a   Zhang, L ^a,b   Chen, G ^a  

^a Duke University   (United States)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; LASER BEAMS; PHASE MEASUREMENT; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SILICON; TEMPERATURE; THERMAL DIFFUSION; THERMAL VARIABLES MEASUREMENT; THERMOCOUPLES; THIN FILMS;

ALUMINUM GALLIUM ARSENIDE; AMPLITUDE SIGNALS; LASER HEATING; LINE SOURCE; PHASE SIGNALS; POINT SOURCE; THERMAL DIFFUSIVITY; THERMAL WAVE MEASUREMENT; UNIFORM BEAM ILLUMINATION;

ELECTRIC HEATING;

EID: 0030169552     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146938     Document Type: Article

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