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Applied Physics Letters

Volumn 77, Issue 20, 2000, Pages 3188-3190

Diffusion of boron in silicon carbide: Evidence for the kick-out mechanism

(4) Bracht, H a Stolwijk, N A a Laube, M b Pensl, G b

a UNIVERSITY OF MÜNSTER (Germany)

b UNIVERSITY OF ERLANGEN NUREMBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001213346 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1325390 Document Type: Article

Times cited : (58)

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