Analysis of system trade-offs for terahertz imaging

Microelectronics Journal

Volumn 31, Issue 7, 2000, Pages 503-514

  Mickan, S ^a   Abbott, D ^a   Munch, J ^a   Zhang, X C ^b   Van Doorn, T ^c  

^a UNIVERSITY OF ADELAIDE   (Australia)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c ROYAL ADELAIDE HOSPITAL   (Australia)

Author keywords

Optoelectronics; T ray imaging; Terahertz; Wavelets

Indexed keywords

EID: 0001183362     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2692(00)00023-9     Document Type: Article

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