Time-domain dielectric constant measurement of thin film in GHz-THz frequency range near the Brewster angle

Applied Physics Letters

Volumn 74, Issue 15, 1999, Pages 2113-2115

  Li, M ^a   Cho, G C ^a   Lu, T M ^a   Zhang, X C ^a   Wang, S Q ^b   Kennedy, J T ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; FOURIER TRANSFORMS; INTERFACES (MATERIALS); LASER MODE LOCKING; PERMITTIVITY; PHASE SHIFT; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS; TIME DOMAIN ANALYSIS;

BREWSTER ANGLE REFLECTIONS; FAR-INFRARED PULSES; FRESNEL EQUATIONS;

DIELECTRIC FILMS;

EID: 0032607986     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123773     Document Type: Article

References (9)

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9. The FLARE film we investigated in this letter is a new class of pure organic nonfluorinated material. This material is labeled as FLARE 2.0™. For more details see: URL http://www.spinon.com