Fowler-Nordheim hole tunneling in p-SiC/SiO2 structures

Applied Physics Letters

Volumn 77, Issue 16, 2000, Pages 2560-2562

  Chanana, R K ^b   McDonald, K ^b   Di Ventra, M ^b   Pantelides, S T ^a,b   Feldman, L C ^a,b   Chung, G Y ^d   Tin, C C ^d   Williams, J R ^d   Weller, R A ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001095907     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1318229     Document Type: Article

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