Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate

Journal of Applied Physics

Volumn 88, Issue 1, 2000, Pages 105-114

  Obayashi, Y ^a   Shintani, K ^a  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000900075     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373630     Document Type: Article

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