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Volumn 77, Issue 7, 2000, Pages 1044-1046

Temperature dependence of capacitance/current-voltage characteristics of highly (0001)-oriented YMnO3 thin films on Si

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EID: 0000862342     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1289067     Document Type: Article
Times cited : (50)

References (27)
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    • W.-J. Lee, B.-G. Yu, J.-S. Lyu, J.-H. Lee, B.-W. Kim, C.-H. Shin, and H.-C. Lee, J. Korean Phys. Soc. 35, S509 (1999); Y. T. Kim and D. S. Shin, Appl. Phys. Lett. 71, 3507 (1997); H. N. Lee, Y. T. Kim, and Y. K. Park, ibid. 74, 3887 (1999); H. N. Lee, Y. T. Kim, and S. H. Choh, ibid. 76, 1066 (2000).
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    • W.-J. Lee, B.-G. Yu, J.-S. Lyu, J.-H. Lee, B.-W. Kim, C.-H. Shin, and H.-C. Lee, J. Korean Phys. Soc. 35, S509 (1999); Y. T. Kim and D. S. Shin, Appl. Phys. Lett. 71, 3507 (1997); H. N. Lee, Y. T. Kim, and Y. K. Park, ibid. 74, 3887 (1999); H. N. Lee, Y. T. Kim, and S. H. Choh, ibid. 76, 1066 (2000).
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