Leakage current of sol-gel derived Pb(Zr, Ti)O3 thin films having Pt electrodes

Applied Physics Letters

Volumn 75, Issue 21, 1999, Pages 3411-3413

  Shin, Ju Cheol ^a   Hwang, Cheol Seong ^a   Kim, Hyeong Joon ^a   Park, Soon Oh ^b  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003073594     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125310     Document Type: Article

References (6)

1. J. C. Shin, J. Park, C. S. Hwang, and H. J. Kim, J. Appl. Phys. 86, 506 (1999).
2. C. S. Hwang, B. T. Lee, K. H. Lee, H. J. Cho, H. Horii, C. S. Kang, W. D. Kim, S. I. Lee, and M. Y. Lee, J. Appl. Phys. 85, 287 (1999).
3. J. F. Scott, M. Azuma, C. A. Paz de Araujo, L. D. McMillan, M. C. Scott, and T. Roberts, Integr. Ferroelectr. 4, 61 (1994).
4. K. C. Kao and W. Hwang, Electrical Transport in Solids (Pergamon, Oxford, 1981), p. 151.
5. M. A. Lampert and P. Mark, Current Injection in Solids (Academic, New York, 1970), p. 25.
6. A. Rose, Phys. Rev. 97, 1538 (1955).