Thermal stability of Pt Schottky contacts to 4H-SiC

Journal of Applied Physics

Volumn 88, Issue 10, 2000, Pages 5724-5728

  Shalish, I ^a,c   De Oliveira, C E M ^a   Shapira, Yoram ^a   Burstein, L ^a   Eizenberg, M ^b  

^a TEL AVIV UNIVERSITY   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000698352     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1319165     Document Type: Article

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