V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging

Nanotechnology

Volumn 9, Issue 4, 1998, Pages 331-336

  Peterson, Charles A ^a   Workman, Richard K ^a   Yao, Xiaowei ^a   Hunt, Jeffery P ^a   Sarid, Dror ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; IMAGING TECHNIQUES; ROBUSTNESS (CONTROL SYSTEMS); SCANNING; WIRE;

FOWLER-NORDHEIM IMAGING;

ATOMIC FORCE MICROSCOPY;

EID: 0032312778     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/9/4/005     Document Type: Article

References (7)

1. O'Shea S J, Atta R M, Murrell M P and Weiland M E 1995 J. Vac. Sci. Technol. B 13 1945
2. Ruskell T G, Workman R K, Chen D, Sand D, Dabl S and Gilbert S 1996 Appl. Phys. Lett. 68 93
3. Ebersberger, Boit, Benzinger and Gunther 1996 Int. Reliability Symp. (Dallas, TX)
4. O'Shea S J, Atta R M and Welland M E 1995 Rev. Sci. Instrum. 66 2503
5. Sarid D 1997 Exploring Scanning Probe Microscopy using Mathematica (New York: Wiley-Interscience)
6. Fowler R H and Nordheim L 1928 Proc. R. Soc. A 119 173
7. Digital Instruments, Inc., Santa Barbara, CA, Nanoscope III AFM system