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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 4 A, 2000, Pages 1796-1800

Microstructural and electrical properties of BaxSr1-xTiO3 thin films on various electrodes

(4) Hong, Seokmin a Bak, Heungjin a An, Ilsin a Kim, Ok Kyung a

a Hanyang University (South Korea)

Author keywords

BST; Buffer layer; Electrodes; Scanning tunneling microscopy; Surface roughness

Indexed keywords

EID: 0000496554 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.1796 Document Type: Article

Times cited : (16)

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