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Volumn 40, Issue 18, 2001, Pages 3124-3131

Modeling optical breakdown in dielectrics during ultrafast laser processing

Author keywords

[No Author keywords available]

Indexed keywords

LASER ABLATION; LASER APPLICATIONS; MATHEMATICAL MODELS; THIN FILMS; ULTRASHORT PULSES;

EID: 0000450213     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.003124     Document Type: Article
Times cited : (72)

References (41)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.