Metal/Al2O3 multilayers: Interface structure, thermal stability and reflectivities in the soft x-ray regime

Journal of Applied Physics

Volumn 84, Issue 6, 1998, Pages 3147-3154

  Veldkamp, M ^a,b   Zabel, H ^b   Schafers F ^a   Mertins, H Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000450101     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368469     Document Type: Article

References (28)

1. J. B. Kortright, J. Magn. Magn. Mater. 156, 271 (1996).
2. H.-J. Stock, U. Kleineberg, B. Heidemann, K. Hilgers, A. Kloidt, B. Schmiedeskamp, U. Heinzmann, M. Krumrey, P. Müller, and F. Scholze, Appl. Phys. A: Solids Surf. 58, 371 (1994).
3. K. M. Skulina, C. S. Alford, R. M. Bionta, J. M. Makowiecki, E. M. Gullikson, R. Soufli, J. B. Kortright, and J. H. Underwood, Appl. Opt. 34, 3727 (1995).
4. H. Nagata and S. Seki, Jpn. J. Appl. Phys., Part 1 29, 569 (1990).
5. M. Arbaoui, R. Barchewitz, C. Sella, and K. B. Youn, Appl. Opt. 29, 477 (1990).
6. H. L. Bai, E. Y. Jiang, and C. D. Wang, Appl. Phys. A: Mater. Sci. Process. 63, 57 (1996).
7. H.-Ch. Mertins, F. Schäfers, H. Grimmer, D. Clemens, P. Böni, and M. Horisberger, Appl. Opt. 37, 1873 (1998).
8. A. D. Akhasakhalgnn, N. N. Kolachevsky, M. M. Mitropulsky, E. N. Rogozin, N. N. Salashchenko, and V. A. Slemzin, Phys. Scr. 48, 516 (1993).
9. F. Schäfers, H.-Ch. Mertins, F. Schmolla, I. Packe, N. N. Salashchenko, and E. A. Shamov, Appl. Opt. 37, 719 (1998).
10. P. Høghøj, K. Joensen, F. E. Christensen, J. Susini, E. Ziegler, A. K. Freund, E. Lüken, and C. Riekel, Proc. SPIE 2011, 354 (1994).
11. E. Ziegler, Y. Lepêtre, S. Joksch, V. Sailer, S. Mourikis, P. J. Viccaro, G. Rolland, and F. Laugier, Rev. Sci. Instrum. 60, 1999 (1989).
12. G. S. Lodha, S. Pandita, A. Gupta, R. V. Nandedkar, and K. Yamashita, Appl. Phys. A: Mater. Sci. Process. 62, 29 (1996).
13. Ch. Morawe and H. Zabel, J. Appl. Phys. 77, 1969 (1995).
14. M. Veldkamp, H. Zabel, and Ch. Morawe, J. Appl. Phys. 83, 159 (1998).
15. Ch. Morawe and H. Zabel, Appl. Phys. Lett. 67, 2612 (1995).
16. Ch. Morawe and H. Zabel, J. Appl. Phys. 80, 3639 (1996).
17. R. W. James, The Optical Principles of the Diffraction of X-rays (G. Bee & Sons, Lid., London, 1948), pp. 54, 137-138.
18. B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables 54, (1993); The data is also published in the world wide web under http:// www-cxro.lbl.gov/optical_constants/asf.html
19. A. G. Michette, Optical Systems for Soft X-rays (Plenum, New York, 1986), p. 109.
20. L. G. Parratt, Phys. Rev. 95, 359 (1954).
21. A. Abromeit, Diploma-thesis, Ruhr-Universität Bochum, Germany, 1992.
22. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980).
23. M. Veldkamp, Diploma-thesis, Ruhr-Universität Bochum, Germany, 1997.
24. Ch. Morawe, Ph.D. thesis, Ruhr-Universität Bochum, Germany, 1996.
25. H. Zabel, Appl. Phys. A: Solids Surf. 58, 159 (1994).
26. M. Veldkamp, H. Zabel, Ch. Morawe, and B. Arnscheidt, J. Appl. Phys 83, 5233 (1998).
27. H. Kiessig, Ann. Phys. (Leipzig) 10, 715 (1931); ibid. 10, 769 (1931).
28. H. Kiessig, Ann. Phys. (Leipzig) 10, 715 (1931); ibid. 10, 769 (1931).