Cr/Sc multilayers for the soft-x-ray range

Applied Optics

Volumn 37, Issue 4, 1998, Pages 719-728

  Schäfers, Franz ^a   Mertins, Hans Christoph ^a   Schmolla, Frank ^a   Packe, Ingo ^a   Salashchenko, Nikolay N ^b   Shamov, Eugeny A ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000733556     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.000719     Document Type: Article

References (33)

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