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Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 271-275

Status and limitations of multilayer x-ray interference structures

(1) Kortright, J B a

a LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTROMAGNETIC WAVE REFLECTION; INTERFACES (MATERIALS); MAGNETOOPTICAL EFFECTS; MATHEMATICAL MODELS; MULTILAYERS; PHOTONS; REFRACTIVE INDEX; SUBSTRATES; SURFACE ROUGHNESS; X RAY DIFFRACTION;

DEBYE-WALTER MODEL; DIFFUSE SCATTERING; INTERDIFFUSION; MULTILAYER COATED SUBSTRATES; MULTILAYER X RAY INTERFERENCE STRUCTURES; NEAR NORMAL INCIDENCE REFLECTANCE; PHOTON ENERGY; SPECULAR REFLECTANCE; SUBSTRATE ROUGHNESS;

MAGNETIC THIN FILMS;

EID: 0030121038 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/0304-8853(95)00866-7 Document Type: Article

Times cited : (12)

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