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Volumn 77, Issue 6, 2000, Pages 901-903

Porous-silicon vapor sensor based on laser interferometry

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000369679     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1306640     Document Type: Article
Times cited : (123)

References (23)
  • 3
    • 0002306372 scopus 로고    scopus 로고
    • EMIS Datareview Series, edited by L. T. Canham INSPEC, London
    • R. Hérino, in Properties of Porous Silicon, EMIS Datareview Series, edited by L. T. Canham (INSPEC, London, 1997), Vol. 18, p. 66.
    • (1997) Properties of Porous Silicon , vol.18 , pp. 66
    • Hérino, R.1
  • 21
    • 0001929694 scopus 로고    scopus 로고
    • EMIS Datareviews Series, edited by L. V. Canham INSPEC, London
    • A. Halimaoui, in Properties of Porous Silicon, EMIS Datareviews Series, edited by L. V. Canham (INSPEC, London, 1997), Vol. 18, p. 18.
    • (1997) Properties of Porous Silicon , vol.18 , pp. 18
    • Halimaoui, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.