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Volumn 17, Issue 4, 1999, Pages 1832-1835

Porous polycrystalline silicon conductivity sensor

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE VAPORS; AMBIENT PRESSURES; CONDUCTIVITY SENSORS; CURRENT INCREASE; ELECTRICAL CONDUCTION MECHANISMS; FABRICATION PROCESS; GAS SPECIES; IN-VACUUM; ORDERS OF MAGNITUDE; ORGANIC VAPORS; POLY-CRYSTALLINE SILICON; VERY LARGE SCALE INTEGRATED;

EID: 0041148704     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581899     Document Type: Conference Paper
Times cited : (12)

References (19)
  • 5
    • 0003735093 scopus 로고
    • edited by Z. C. Feng and R. Tsu World Scientific
    • Porous Silicon, edited by Z. C. Feng and R. Tsu (World Scientific, 1994).
    • (1994) Porous Silicon
  • 16
    • 78649776302 scopus 로고
    • edited by M. Prudenziati Elsevier, New York
    • Thick Films Sensors, edited by M. Prudenziati (Elsevier, New York, 1994), p. 290.
    • (1994) Thick Films Sensors , pp. 290


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.