Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 12, 1998, Pages R7516-R7519

  Smoliner, J ^a   Heer, R ^a   Eder, C ^a   Strasser, G ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000341365     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.R7516     Document Type: Article

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