SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 199-206

A theoretical analysis of ballistic electron emission microscopy: k-space distributions and spectroscopy

(5) De Andres, P L a Reuter, K a Garcia Vidal, F J a Sestovic, D a Flores, F a

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTAL LATTICES; ELECTRIC CURRENTS; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRON SCATTERING; GOLD; GREEN'S FUNCTION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON;

BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM);

SEMICONDUCTOR METAL BOUNDARIES;

EID: 17644444984 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00428-5 Document Type: Article

Times cited : (11)

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