Imaging individual dopant atoms on cleavage surfaces of wurtzite-structure compound semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 4, 1999, Pages 2995-2999

  Siemens, B ^a   Domke, C ^a   Heinrich, M ^a   Ebert, P ^a   Urban, K ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000208105     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.2995     Document Type: Article

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