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Volumn 16, Issue 5, 1998, Pages 2825-2832

Oscillating contrast in room-temperature scanning tunneling microscope images of localized charges in III-V semiconductor cleavage surfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001679223     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590278     Document Type: Article
Times cited : (32)

References (34)
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    • Ebert, Ph.1
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    • unpublished
    • B. Siemens et al. (unpublished).
    • Siemens, B.1
  • 27
    • 0003323054 scopus 로고
    • Semiconductor Surfaces and Interfaces
    • Springer. Berlin
    • W. Mönch. Semiconductor Surfaces and Interfaces, Springer Series in Surface Sciences. Vol. 26 (Springer. Berlin, 1995).
    • (1995) Springer Series in Surface Sciences , vol.26
    • Mönch, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.