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Volumn 72, Issue 19, 1998, Pages 2454-2456
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Microscopic behavior of silicon in silicon delta-doped layer in GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001685054
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.121380 Document Type: Article |
Times cited : (22)
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References (13)
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