Erasable electrostatic lithography for quantum components

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 25, Issue 2-3 SPEC.ISS., 2004, Pages 319-325

  Crook, R ^a   Smith, G G ^a   Graham, A C ^a   Farrer, I ^a   Beere, H E ^a   Ritchie, D A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Erasable electrostatic lithography; GaAs; Scanning probe; Surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELECTROSTATICS; IMAGE ANALYSIS; LIGHT EMITTING DIODES; OPTIMIZATION; PROBES; QUANTUM THEORY; SCANNING; SEMICONDUCTING GALLIUM ARSENIDE;

CHARGE DENSITY; ERASABLE ELECTROSTATIC LITHOGRAPHY; QUANTUM COMPONENTS; SCANNING PROBES;

LITHOGRAPHY;

EID: 9744235240     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2004.06.031     Document Type: Conference Paper

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