Bipolar absolute differential confocal approach to higher spatial resolution

Optics Express

Volumn 12, Issue 21, 2004, Pages 5013-5021

  Zhao, Weiqian ^a   Tan, Jiubin ^a   Qiu, Lirong ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; OPTICAL FILTERS; OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE MEASUREMENT;

ANNULAR BEAMS; CONFOCAL MICROSCOPY; SPATIAL RESOLUTION; SUPERRESOLUTION;

OPTICAL RESOLVING POWER;

EID: 9144269121     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.005013     Document Type: Article

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