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Volumn 28, Issue 19, 2003, Pages 1772-1774
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Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
DIFFRACTION;
FLUORESCENCE;
MATHEMATICAL MODELS;
MAXIMUM LIKELIHOOD ESTIMATION;
CONFOCAL MICROSCOPY;
IMAGING SYSTEMS;
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EID: 0141963349
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.28.001772 Document Type: Article |
Times cited : (23)
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References (16)
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