메뉴 건너뛰기




Volumn 15, Issue 11, 2004, Pages 2175-2187

Frequency scanning interferometry in ATLAS: Remote, multiple, simultaneous and precise distance measurements in a hostile environment

Author keywords

Absolute distance interferometry; ATLAS; Frequency scanning interferometry; FSI; Hostile environment; Large Hadron Collider; Length measurement; LHC; Phase measurement; Remote measurement; SCT; Simultaneous measurement

Indexed keywords

INTERFEROMETRY; LASERS; PHASE SHIFT; SENSITIVITY ANALYSIS; SIGNAL PROCESSING;

EID: 8644247369     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/11/001     Document Type: Article
Times cited : (90)

References (21)
  • 1
    • 0030383809 scopus 로고    scopus 로고
    • Frequency scanned interferometry (FSI): The basis of a survey system for ATLAS using fast automated remote interferometry
    • Fox-Murphy A F, Howell D F, Nickerson R B and Weidberg A R 1996 Frequency scanned interferometry (FSI): the basis of a survey system for ATLAS using fast automated remote interferometry Nucl. Instrum. Methods A 383 229-37
    • (1996) Nucl. Instrum. Methods A , vol.383 , pp. 229-237
    • Fox-Murphy, A.F.1    Howell, D.F.2    Nickerson, R.B.3    Weidberg, A.R.4
  • 2
    • 0003611395 scopus 로고    scopus 로고
    • The ATLAS Collaboration CERN/LHCC/97-16 ATLAS TDR 4 (Geneva: CERN) online at
    • The ATLAS Collaboration 1997 Inner Detector Technical Design Report CERN/LHCC/97-16 ATLAS TDR 4 (Geneva: CERN) online at http://atlas.web.cern.ch/Atlas/ GROUPS/INNER_DETECTOR/TDR/tdr.html
    • (1997) Inner Detector Technical Design Report
  • 4
    • 0035398713 scopus 로고    scopus 로고
    • The ATLAS semiconductor tracker
    • Turala M 2001 The ATLAS semiconductor tracker Nucl. Instrum. Methods A 466 243-54
    • (2001) Nucl. Instrum. Methods A , vol.466 , pp. 243-254
    • Turala, M.1
  • 5
    • 0032117311 scopus 로고    scopus 로고
    • High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes
    • Barwood G P, Gill P and Rowley W R C 1998 High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes Meas. Sci. Technol. 9 1036-41
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 1036-1041
    • Barwood, G.P.1    Gill, P.2    Rowley, W.R.C.3
  • 6
    • 84952620634 scopus 로고
    • Absolutinterferometrie mit durchstimmbaren Halbleiterlasern
    • Pfeifer T and Thiel J 1993 Absolutinterferometrie mit durchstimmbaren Halbleiterlasern Tech. Mess. 60 185-91
    • (1993) Tech. Mess. , vol.60 , pp. 185-191
    • Pfeifer, T.1    Thiel, J.2
  • 7
    • 0001199708 scopus 로고    scopus 로고
    • Absolute interferometry with a 670-nm external cavity diode laser
    • Stone J A, Stejskal A and Howard L 1999 Absolute interferometry with a 670-nm external cavity diode laser Appl. Opt. 38 5981-94
    • (1999) Appl. Opt. , vol.38 , pp. 5981-5994
    • Stone, J.A.1    Stejskal, A.2    Howard, L.3
  • 8
    • 0013060356 scopus 로고    scopus 로고
    • Absolute distanzinterferometrie mit variabler synthetischer Wellenlänge
    • Salewski K D, Bechstein K H, Wolfram A and Fuchs W 1996 Absolute distanzinterferometrie mit variabler synthetischer Wellenlänge Tech. Mess. 63 5-13
    • (1996) Tech. Mess. , vol.63 , pp. 5-13
    • Salewski, K.D.1    Bechstein, K.H.2    Wolfram, A.3    Fuchs, W.4
  • 9
    • 0000112653 scopus 로고    scopus 로고
    • Absolute interferometric distance measurements applying a variable synthetic wavelength
    • Bechstein K H and Fuchs W 1998 Absolute interferometric distance measurements applying a variable synthetic wavelength J. Opt. 29 179-82
    • (1998) J. Opt. , vol.29 , pp. 179-182
    • Bechstein, K.H.1    Fuchs, W.2
  • 10
    • 0029368484 scopus 로고
    • Interferometric measurement of absolute distances of up to 40 m
    • Thiel J, Pfeifer T and Hartmann M 1995 Interferometric measurement of absolute distances of up to 40 m Measurement 16 1-6
    • (1995) Measurement , vol.16 , pp. 1-6
    • Thiel, J.1    Pfeifer, T.2    Hartmann, M.3
  • 12
    • 0004038250 scopus 로고
    • 2nd edn (Wokingham: Addison-Wesley)
    • Hecht E 1987 Optics 2nd edn (Wokingham: Addison-Wesley) pp 346-61
    • (1987) Optics , pp. 346-361
    • Hecht, E.1
  • 14
  • 15
    • 0037153354 scopus 로고    scopus 로고
    • The ATLAS semiconductor tracker - Overview and status
    • Eklund L 2002 The ATLAS semiconductor Tracker-overview and status Nucl. Instrum. Methods A 494 102-6
    • (2002) Nucl. Instrum. Methods A , vol.494 , pp. 102-106
    • Eklund, L.1
  • 17
    • 0002834304 scopus 로고
    • Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures
    • Carré P 1966 Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures Metrologia 2 13-23
    • (1966) Metrologia , vol.2 , pp. 13-23
    • Carré, P.1
  • 19
    • 0000130416 scopus 로고
    • 'MINUIT' a system for function minimization and analysis of the parameter errors and correlations
    • James F and Roos M 1975 'MINUIT' a system for function minimization and analysis of the parameter errors and correlations Comput. Phys. Commun. 10 343-67
    • (1975) Comput. Phys. Commun. , vol.10 , pp. 343-367
    • James, F.1    Roos, M.2
  • 21
    • 85034737299 scopus 로고    scopus 로고
    • Physik Instrumente Private communication with manufacturers
    • Physik Instrumente 2000 Private communication with manufacturers
    • (2000)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.