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Volumn 494, Issue 1-3, 2002, Pages 102-106
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The ATLAS semiconductor tracker - Overview and status
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Author keywords
ATLAS; Radiation Hardness Production; Silicon strip; Test beam; Tracking
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Indexed keywords
BINARY CODES;
DISKS (MACHINE COMPONENTS);
OPTICAL LINKS;
PARTICLE DETECTORS;
QUALITY CONTROL;
RADIATION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR TRACKERS (SCT);
PARTICLE BEAM TRACKING;
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EID: 0037153354
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(02)01452-3 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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