High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes

Measurement Science and Technology

Volumn 9, Issue 7, 1998, Pages 1036-1041

  Barwood, G P ^a   Gill, P ^a   Rowley, W R C ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Heterodyne interferometry; Laser diodes; Length metrology; Swept frequency metrology

Indexed keywords

ETALONS; INTERFEROMETRY; RUBIDIUM; SEMICONDUCTOR LASERS;

HETERODYNE INTERFEROMETRY; LENGTH METROLOGY; SWEPT FREQUENCY METROLOGY;

FABRY-PEROT INTERFEROMETERS;

EID: 0032117311     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/7/005     Document Type: Article

References (26)

1. Kikuta H, Iwata K and Nagata R 1986 Distance measurement by the wavelength shift of laser diode light Appl. Opt. 25 2976-80
2. Beheim G and Fritsch K 1986 Range finding using frequency-modulated laser diode Appl. Opt. 25 1439-42
3. Gerstner K and Tschudi T 1994 New diode laser light source for absolute ranging two-wavelength interferometry Opt. Eng. 33 (8) 2692-6
4. Imai M and Kawakita K 1990 Optical-heterodyne displacement measurement using a frequency-ramped laser diode Opt. Commun. 78 113-7
5. Kubota T, Nara M and Yoshino T 1987 Interferometer for measuring displacement and distance Opt. Lett. 12 310-2
6. Seta K and Ward B K 1990 Interferometric absolute distance measurement utilising a mode-jump region of a laser diode Opt. Commun. 77 275-8
7. Ohba R, Uehira I and Kakuma S 1990 Interferometric determination of a static optical path difference using a frequency swept laser diode Meas. Sci. Technol. 1 500-4
8. Rovati L, Minoni U and Docchio F 1997 Dispersive white light combined with a frequency-modulated continuous-wave interferometer for high-resolution absolute measurement of distance Opt. Lett. 22 (12) 850-2
9. Zhu Y, Matsumoto H and O'ishi T 1991 Arm-length measurement of an interferometer using the optical-frequency-scanning technique Appl. Opt. 30 3561-2
10. Mahal V and Arie A 1996 Distance measurement using two frequency-stabilized Nd:YAG lasers Appl. Opt. 35 (16) 3010-5
11. Barwood G P, Gill P and Rowley W R C 1993 Laser diodes for length determination using swept-frequency interferometry Meas. Sci. Technol. 4 988-94
12. Thiel J, Pfeifer T and Hartman M 1995 Interferometric measurement of absolute distances of up to 40 m Measurement 16 1-6
13. 3/2 state Opt. Lett. 21 (16) 1280-2
14. Barwood G P, Gill P and Rowley W R C 1991 Frequency measurements on optically-narrowed Rb-stabilized laser diodes Appl. Phys. B 53 142-7
15. 10 absolute accuracy Proc. SPIE 1837 262-70
16. Dahmani B, Hollberg L and Drullinger R 1987 Frequency stabilisation of semiconductor lasers by resonant optical feedback Opt. Lett. 12 876-8
17. Barwood G P, Gill P and Rowley W R C 1992 Longitudinal mode control in laser diodes Meas. Sci. Technol. 3 406-10
18. Boshier M G, Berkeland D, Hinds E A and Sandoghdar V 1991 External-cavity frequency stabilisation of visible and infrared semiconductor lasers for high resolution spectroscopy Opt. Commun. 85 355-9
19. Wandt D, Laschek M, Przyklenk K, Tünnermann A and Welling H 1996 External cavity laser diode with 40 nm continuous tuning range around 825 nm Opt. Commun. 130 81-4
20. Kazharsky O, Pakhomov S, Grachev A, Mironov Y, Goncharovn I and Matveev A 1997 Broad continuous frequency tuning of a diode laser with an external cavity Opt. Commun. 137 77-82
21. Sharp 1988 Laser Diode User's Manual Sharp Corporation Electronic Components Group, 22-22 Nagalke-cho, Abeno-ku, Osaka 545, Japan p 18
22. 2 reference frequencies for 1S-2S transitions in hydrogenlike atoms Phys. Rev. A 43 4783-90
23. Zimmermann E, Salvade Y and Dandliker R 1996 Stabilized three-wavelength source calibrated by electronic means for high-accuracy absolute distance measurement Opt. Lett. 21 (7) 531-3
24. Edwards C S, Barwood G P, Gill P, Rodríguez-Llorente and Rowley W R C 1996 Frequency-stabilized diode lasers in the visible region using Doppler-free iodine spectra Opt. Commun. 132 94-100
25. Simonsen H R 1997 Iodine-stabilized extended cavity diode laser at λ. = 633 nm IEEE Trans. Instrum. Meas. 46 (2) 141-4
26. Zarka A, Chartier J-M, Åman J and Jaatinen E 1997 Intracavity iodine cell spectroscopy with an extended-cavity laser diode around 633 nm IEEE, Trans. Instrum. Meas. 46 (2) 145-8