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Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 96, Issue 5, 2005, Pages 429-437

StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling

(1) Walther, Thomas a,b

a UNIVERSITY OF BONN (Germany)

b CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR (Germany)

Author keywords

Analytical TEM; EELS; EFTEM; Interdiffusion; Segregation

Indexed keywords

CHARGE COUPLED DEVICES; CHEMICAL ANALYSIS; DETECTORS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; SEGREGATION (METALLOGRAPHY); SHELLS (STRUCTURES); THIN FILMS;

ANALYTICAL TEM; EFTEM; ELECTRON SPECTROSCOPIC IMAGING (ESI); INTERDIFFUSION;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 20344388796 PISSN: 00443093 EISSN: None Source Type: Journal
DOI: 10.3139/146.018131 Document Type: Conference Paper

Times cited : (2)

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