IC Dia gnostic with Time Resolved Photon Emission and CAD Auto-channeling

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2003-November, Issue , 2003, Pages 45-54

  Desplats, Romain ^a   Eral, Alban ^a   Beaudoin, Felix ^a   Perdu, Philippe ^a   Chion, Alain ^b   Shah, Ketan ^c   Lundquist, Ted ^c  

^a CNES   (France)

^b STMICROELECTRONICS   (France)

^c NPTest Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; INTEGRATED CIRCUITS; PHOTONS; TIMING CIRCUITS;

EMISSION AREA; PHOTON EMISSIONS; PRECISE LOCATIONS; TIME RESOLVED PHOTON EMISSIONS; VIRTUAL LAYERS;

TRANSISTORS;

EID: 85124070036     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa2003p0045     Document Type: Conference Paper

References (6)

1. J. C. Tsang J. A. Kash and D. P. Vallett, "Picosecond Imaging Circuit Analysis", IBM J. RES. DEVELOP.44 (2000)
2. V. Fischetti, S. E. Laux and E. Crabbé, "Understanding Hot-Electron Transport in Silicon Devices: Is There a Shortcut?", J. Appl. Phys., vol. 78, No. 2, pp. 1058-1087, 15 July 1995
3. R. Desplats et Al., "Automated Pica Transistor Channeling and Spatial-Temporal Photon Correlation for Faster Ic Diagnosis", IRPS2003.
4. R. Desplats, T. Dargnies, J-C. Courrege "Automatic determination of optimal FIB operations for improved circuit probing and fast reconfiguration", ISTFA, 12-16 November 2000 Seattle (USA).
5. R. Desplats et Al., "Fault Localization using Time Resolved Photon Emission and STIL Waveforms", ICT, September 2003.
6. A. Eral, "Spatial Temporal Photon Correlation STPC-3D", CNES internal report. June 2003.