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Volumn 137, Issue , 2008, Pages 181-191

The Long Trace Profilers

Author keywords

Brookhaven National Laboratory; European Synchrotron Radiation Facility; Optic Head; Quarter Wave Plate; Reference Mirror

Indexed keywords


EID: 85103624946     PISSN: 03424111     EISSN: 15561534     Source Type: Book Series    
DOI: 10.1007/978-3-540-74561-7_10     Document Type: Chapter
Times cited : (16)

References (16)
  • 5
    • 85103613448 scopus 로고    scopus 로고
    • http://www.oceanoptics.com/
  • 7
    • 0043269335 scopus 로고    scopus 로고
    • Technique for measuring the groove density of diffraction gratings using the long trace profiler
    • D. Cocco, G. Sostero, M. Zangrando, Technique for measuring the groove density of diffraction gratings using the long trace profiler, Rev. Sci. Instrum. 74–7, 3544 (2003)
    • (2003) Rev. Sci. Instrum. , vol.74 , Issue.7 , pp. 3544
    • Cocco, D.1    Sostero, G.2    Zangrando, M.3
  • 13
    • 85103635235 scopus 로고    scopus 로고
    • http://costp7.free.fr/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.