Development of elliptical kirkpatrick-baez mirrors for hard X-ray nanofocusing

Optics InfoBase Conference Papers

Volumn , Issue , 2005, Pages

  Yamauchi, K ^a   Mimura, H ^a   Yamamura, K ^a   Sano, Y ^a   Yumoto, H ^a   Matsuyama, S ^a   Endo, K ^a   Nishino, Y ^b   Tamasaku, K ^b   Yabashi, M ^c   Ishikawa, T ^b,c   Mori, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

^b RIKEN SPring 8 Center   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; OPTICAL TESTING;

ASPHERICAL; FORM ACCURACY; HARD X RAY; K-B MIRRORS; KIRKPATRICK-BAEZ MIRROR; NANO-FOCUSING; SIZE FOCUSING; TESTING METHOD;

X RAYS;

EID: 85086619274     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/fio.2005.ftus4     Document Type: Conference Paper

References (8)

1. K. Yamauchi et al., J. Synchrotron rad., 9 (2002), 313-316.
2. K. Yamauchi et al., Jpn. J. Appl. Phys., Part1 42 (2003), 7129-7134.
3. Y. Mori et al., Rev. Sci. Instrum., 71 (2000), 4627-4632.
4. K. Yamauchi et al., Rev. Sci. Instrum., 73 (2002), 4028-4033.
5. K. Yamauchi et al., Rev. Sci. Instrum., 74 (2003), 2894-2898.
6. H. Mimura et al., Rev. Sci. Instrum., to be published.
7. H. Yumoto et al., Rev. Sci. Instrum., to be published.
8. H. Mimura et al., Jpn. J. Appl. Phys. 44 (2005) L539-L542.