Improving NAND endurance by dynamic program and erase scaling

5th USENIX Workshop on Hot Topics in Storage and File Systems, HotStorage 2013

Volumn , Issue , 2013, Pages

  Jeong, Jaeyong ^a   Hahn, Sangwook Shane ^a   Lee, Sungjin ^a   Kim, Jihong ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FILE ORGANIZATION; FLASH MEMORY;

DYNAMIC PROGRAMS; ERASE VOLTAGES; LINEAR DEPENDENCE; NAND FLASH MEMORY; NEW APPROACHES; TRADE-OFF RELATIONSHIP; WRITE SPEED; WRITE THROUGHPUTS;

NAND CIRCUITS;

EID: 85084162845     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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