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Volumn , Issue , 2010, Pages

How I learned to stop worrying and love flash endurance

Author keywords

[No Author keywords available]

Indexed keywords

FILE ORGANIZATION; MOLECULAR BIOLOGY; RECOVERY;

EID: 85084161087     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (55)

References (19)
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  • 4
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    • A dual-mode NAND flash memory: 1-Gb multilevel and high-performance 512-mb single-level modes
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    • Cho, T.1
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    • MICRO 2009
    • Grupp, L.1
  • 7
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    • Disk drive roadmap from the thermal perspective: A case for dynamic thermal management
    • S. Gurumurthi, A. Sivasubramaniam, and V. Natarajan. Disk Drive Roadmap from the Thermal Perspective: A Case for Dynamic Thermal Management. ISCA, 2005.
    • (2005) ISCA
    • Gurumurthi, S.1    Sivasubramaniam, A.2    Natarajan, V.3
  • 9
    • 85080622049 scopus 로고    scopus 로고
    • Process integration and device structures
    • Process Integration and Device Structures, ITRS 2007 Edition.
    • ITRS 2007 Edition
  • 10
    • 0038306352 scopus 로고    scopus 로고
    • A 1.8v NAND flash memory for mass storage applications
    • J. Lee and et al. A 1.8V NAND Flash Memory for Mass Storage Applications. ISSCC, 2003.
    • (2003) ISSCC
    • Lee, J.1
  • 11
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    • Recovery effects in the distributed cycling of flash memories
    • N. Mielke and et al. Recovery effects in the distributed cycling of flash memories. IRPS, 2006.
    • (2006) IRPS
    • Mielke, N.1
  • 12
    • 77649273254 scopus 로고    scopus 로고
    • N. R. Mielke. Intel Corporation, October
    • N. R. Mielke. Intel Corporation, October 2009. Private Correspondence.
    • (2009) Private Correspondence
  • 13
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    • 2 1gb NAND flash memory with 10 MB/s program throughput
    • 2 1Gb NAND Flash Memory with 10 MB/s Program Throughput. ISSCC, 2002.
    • (2002) ISSCC
    • Nakamura, H.1
  • 14
    • 0032097823 scopus 로고    scopus 로고
    • Degradation of thin tunnel gate oxide under constant fowlernordheim current stress for a flash eeprom
    • Y. Park and D. Schroder. Degradation of thin tunnel gate oxide under constant fowlernordheim current stress for a flash eeprom. TED, 1998.
    • (1998) TED
    • Park, Y.1    Schroder, D.2
  • 15
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    • Characterization of storage workload traces from production windows servers
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    • Kavalanekar, S.1
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    • A novel analysis method of threshold voltage shift due to detrap in a multi-level flash memory
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    • Yamada, R.1
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    • Reliability issues and models of sub-90nm NAND flash memory cells
    • H. Yang and et al. Reliability issues and models of sub-90nm nand flash memory cells. ICSICT, 2006.
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    • Yang, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.