Atomic force microscopy with lateral modulation

NanoScience and Technology

Volumn 0, Issue , 2019, Pages 75-115

  Scherer, Volker ^a   Reinstädtler, Michael ^b   Arnold, Walter ^c  

^a Federal Mogul Holdings Deutschland GmbH   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

^c FRAUNHOFER INSTITUTE FOR NONDESTRUCTIVE TESTING IZFP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85073670935     PISSN: 14344904     EISSN: 21977127     Source Type: Book Series    
DOI: 10.1007/978-3-642-35792-3_3     Document Type: Chapter

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