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Volumn , Issue , 2004, Pages

Evaluation of power devices for automotive hybrid and 42V based systems

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL TECHNOLOGY; FUEL CELLS; FUEL ECONOMY;

EID: 85072419774     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2004-01-1682     Document Type: Conference Paper
Times cited : (7)

References (13)
  • 1
    • 84877241034 scopus 로고    scopus 로고
    • Massachusetts Institute of Technology 42V Consortium website, ISO/CD 21848.4, January 23, Graphic by Harry Husted, Delphi Corporation
    • Massachusetts Institute of Technology 42V Consortium website, http://mit42v.mit.edu, ISO/CD 21848.4, January 23, 2003. Graphic by Harry Husted, Delphi Corporation.
    • (2003)
  • 4
    • 0033877702 scopus 로고    scopus 로고
    • Reliability of thick Al wire bonds in IGBT modules for traction motor drives
    • DOI 10.1109/6040.826768
    • Onuki J., Koizumi M., Suwa M., "Reliability of Thick Al Wire Bonds in IGBT Modules for Traction Motor Drives" IEEE Transactions on Advanced Packaging, Vol 23, No. 1, pp. 108-112, February 2000. (Pubitemid 30583959)
    • (2000) IEEE Transactions on Advanced Packaging , vol.23 , Issue.1 , pp. 108-112
    • Onuki, J.1    Koizumi, M.2    Suwa, M.3
  • 6
    • 84877199642 scopus 로고    scopus 로고
    • AEC website
    • AEC website: www.aecouncil.com
  • 7
    • 0036045176 scopus 로고    scopus 로고
    • Analytical model for thermal instability of low voltage power MOS and SOA in pulse operation
    • June
    • Spirito P., Breglio G., d'Alessandro V., Rinaldi N., "Analytical model for thermal instability of low voltage power MOS and SOA in pulse operation" IEEE ISPSD 2002, June 2002, pp. 269-272.
    • (2002) IEEE ISPSD 2002 , pp. 269-272
    • Spirito, P.1    Breglio, G.2    D'Alessandro, V.3    Rinaldi, N.4
  • 9
    • 0032598956 scopus 로고    scopus 로고
    • COOLMOS™-a new milestone in high voltage power MOS
    • May
    • Lorenz L., Deboy G., Knapp A., Marz M., "COOLMOS™-a new milestone in high voltage power MOS" IEEE ISPSD 1999, May 1999, pp. 3-10.
    • (1999) IEEE ISPSD 1999 , pp. 3-10
    • Lorenz, L.1    Deboy, G.2    Knapp, A.3    Marz, M.4
  • 10
    • 33646891147 scopus 로고    scopus 로고
    • Silicon carbide benefits and advantages for power electronics circuits and systems
    • DOI 10.1109/JPROC.2002.1021562, PII S0018921902055767
    • Elasser A., Chow T.P., "Silicon Carbide Benefits and Advantages for Power Electronics Circuits and Systems" Proc. IEEE, vol. 90, no. 6, pp. 969-986, June 2002. (Pubitemid 43785870)
    • (2002) Proceedings of the IEEE , vol.90 , Issue.6 , pp. 969-986
    • Elasser, A.1    Chow, T.P.2
  • 11
    • 0036590719 scopus 로고    scopus 로고
    • The Toughest Transistor Yet
    • May
    • Eastman L., Mishra U., "The Toughest Transistor Yet." IEEE Spectrum, May 2002, pp. 28-33
    • (2002) IEEE Spectrum , pp. 28-33
    • Eastman, L.1    Mishra, U.2
  • 12
    • 84877202425 scopus 로고    scopus 로고
    • Prospects of SiC Power Devices from the State of the Art to Future Trends
    • Nuremberg, Germany, May
    • Stephani D., "Prospects of SiC Power Devices From the State of the Art to Future Trends" PCIM Europe 2002 Conference Proceedings, Nuremberg, Germany, May 2002.
    • (2002) PCIM Europe 2002 Conference Proceedings
    • Stephani, D.1
  • 13
    • 0038426995 scopus 로고    scopus 로고
    • High-Temperature Electronics - A Role for Wide Bandgap Semiconductors?
    • June
    • Neudeck P.G., Okojie R.S., Chen L., "High-Temperature Electronics-A Role for Wide Bandgap Semiconductors?" Proc. IEEE, vol. 90, no. 6, pp. 1065-1075, June 2002.
    • (2002) Proc. IEEE , vol.90 , Issue.6 , pp. 1065-1075
    • Neudeck, P.G.1    Okojie, R.S.2    Chen, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.