Photocurrent studies of stress and aging in pentacene thin film transistors

Applied Physics Letters

Volumn 89, Issue 22, 2006, Pages

  Fraboni, Beatrice ^a   Matteucci, Andrea ^a   Cavallini, Anna ^a   Orgiu, Emanuele ^b   Bonfiglio, Annalisa ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; CHARGE CARRIERS; ELECTRIC CHARGE; ELECTRON TRAPS; PHOTOCURRENTS; THIN FILM DEVICES; TRANSPORT PROPERTIES;

ORGANIC THIN FILM DEVICES; PENTACENE THIN FILM TRANSISTORS; PHOTOCURRENT SPECTROSCOPY; TRANSITION ENERGY;

THIN FILM TRANSISTORS;

EID: 33751581038     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2398897     Document Type: Article

References (15)

1. R. H. Reuss et al., Proc. IEEE 93, 1239 (2005).
2. M. Tiago, J. Northrup, and S. Louie, Phys. Rev. B 67, 115212 (2003).
3. J. Lee, S. Kim, K. Kim, J. Kim, and S. Im, Appl. Phys. Lett. 84, 1701 (2004).
4. C. Voz, J. Puigdollers, I. Martin, D. Munoz, A. Orpella, M. Vetter, R. Alcubilla, Sol. Energy Mater. Sol. Cells 87, 567 (2005).
5. M. Knupfer and H. Berger, Chem. Phys. 325, 92 (2006).
6. G. Horowitz, F. Kouki, and P. Valat, Phys. Rev. B 59, 10651 (1999).
7. C. Dimitrakopoulos and P. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
8. T. Stubinger and W. Brutting, J. Appl. Phys. 90, 3632 (2001).
9. O. Ostroverkhova, S. Shcherbyna, D. Cooke, R. Egerton, F. Hegmann, R. Tykwinski, S. Parkin, and J. Anthony, J. Appl. Phys. 98, 33701 (2005).
10. I. Biaggio, V. Podzorov, M. Calhoun, and M. Gershenson, Phys. Rev. Lett. 96, 566204 (2006).
11. M. Harrison, J. Gruner, and G. Spencer, Phys. Rev. B 55, 7831 (1987).
12. O. Jurchescu, J. Baas, and T. Palstra, Appl. Phys. Lett. 87, 52102 (2005).
13. Z. Zhu, J. Mason, R. Dieckmann, and G. Malliaras, Appl. Phys. Lett. 81, 4643 (2002).
14. Y. Qiu, Y. Hu, G. Dong, L. Wang, J. Xie, and Y. Ma, Appl. Phys. Lett. 83, 1644 (2003).
15. D. Dunlap, P. Parris, and V. Kenkre, Phys. Rev. Lett. 81, 4472 (1998).