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Volumn 21, Issue 47, 2010, Pages

Thermal activation and quantum field emission in a sketch-based oxide nanotransistor

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT FLOWS; DIELECTRIC ANOMALY; DIRECT MEASUREMENT; ELECTRONIC COUPLING; GATE DRAIN; LOW TEMPERATURES; MEMORY ELEMENT; NANO TRANSISTORS; NEAR ROOM TEMPERATURE; POTENTIAL BARRIERS; QUANTUM DEVICE; ROOM TEMPERATURE; SOURCE-DRAIN; SRTIO; STRUCTURAL PHASE TRANSITION; THERMAL ACTIVATION;

EID: 78650131520     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/47/475201     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.