In situ XRD investigation of Cu2ZnSnSe4 thin film growth by thermal co-evaporation

Physica Status Solidi (A) Applications and Materials Science

Volumn 211, Issue 9, 2014, Pages 1991-1996

  Kaune, Gunar ^a   Hartnauer, Stefan ^a   Scheer, Roland ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Cu2ZnSnSe4; growth; thermal co evaporation; thin films; X ray diffraction

Indexed keywords

COPPER; DEPOSITION; EVAPORATION; GROWTH (MATERIALS); SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

DEPOSITION CONDITIONS; ELEVATED TEMPERATURE; IN-SITU ANALYSIS; IN-SITU X-RAY DIFFRACTION; INITIAL PROCESS; SECONDARY PHASE; THERMAL CO-EVAPORATION; THIN-FILM DEPOSITIONS;

FILM GROWTH;

EID: 85027918776     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201330340     Document Type: Article

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