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Volumn 535, Issue 1, 2013, Pages 73-77
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Investigation of the solid state reactions by time-resolved X-ray diffraction while crystallizing kesterite Cu2ZnSnSe4 thin films
b
AVANCIS GMBH
(Germany)
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Author keywords
Cu2ZnSnSe4; CZTSe; Formation reaction; In situ XRD; Raman; SnSe; Sputtering
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Indexed keywords
CU2ZNSNSE4;
CZTSE;
FORMATION REACTION;
IN-SITU XRD;
RAMAN;
SNSE;
CRYSTALLIZATION KINETICS;
DEPOSITS;
POLYIMIDES;
RAMAN SPECTROSCOPY;
SELENIUM COMPOUNDS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SOLID STATE REACTIONS;
SPUTTERING;
TIN;
X RAY DIFFRACTION;
COPPER COMPOUNDS;
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EID: 84878208932
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2013.01.054 Document Type: Article |
Times cited : (29)
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References (14)
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