-
1
-
-
0242498488
-
An analysis of four missing data treatment methods for supervised learning
-
Batista, G.E.A.P.A., Monard, M.C., An analysis of four missing data treatment methods for supervised learning. Applied Artificial Intelligence 17 (2003), 519–533.
-
(2003)
Applied Artificial Intelligence
, vol.17
, pp. 519-533
-
-
Batista, G.E.A.P.A.1
Monard, M.C.2
-
2
-
-
0035478854
-
Random forests
-
Breiman, L., Random forests. Machine Learning 45 (2001), 5–32.
-
(2001)
Machine Learning
, vol.45
, pp. 5-32
-
-
Breiman, L.1
-
3
-
-
68049121093
-
Anomaly detection: A survey
-
Chandola, V., Banerjee, A., Kumar, V., Anomaly detection: A survey. ACM Computing Surveys, 41, 2009, 15.
-
(2009)
ACM Computing Surveys
, vol.41
, pp. 15
-
-
Chandola, V.1
Banerjee, A.2
Kumar, V.3
-
4
-
-
84979707878
-
Data-driven innovation to capture user-experience product design: An empirical study for notebook visual aesthetics design
-
Chien, C.-F., Kerh, R., Lin, K.-Y., Yu, A.P.-I., Data-driven innovation to capture user-experience product design: An empirical study for notebook visual aesthetics design. Computers & Industrial Engineering 99 (2016), 162–173.
-
(2016)
Computers & Industrial Engineering
, vol.99
, pp. 162-173
-
-
Chien, C.-F.1
Kerh, R.2
Lin, K.-Y.3
Yu, A.P.-I.4
-
5
-
-
33845660695
-
Data mining for yield enhancement in semiconductor manufacturing and an empirical study
-
Chien, C.-F., Wang, W.-C., Cheng, J.-C., Data mining for yield enhancement in semiconductor manufacturing and an empirical study. Expert Systems with Applications 33 (2007), 192–198.
-
(2007)
Expert Systems with Applications
, vol.33
, pp. 192-198
-
-
Chien, C.-F.1
Wang, W.-C.2
Cheng, J.-C.3
-
6
-
-
72449130980
-
Data mining in manufacturing: A review based on the kind of knowledge
-
Choudhary, A.K., Harding, J.A., Tiwari, M.K., Data mining in manufacturing: A review based on the kind of knowledge. Journal of Intelligent Manufacturing 20 (2008), 501–521.
-
(2008)
Journal of Intelligent Manufacturing
, vol.20
, pp. 501-521
-
-
Choudhary, A.K.1
Harding, J.A.2
Tiwari, M.K.3
-
7
-
-
84919773193
-
Do we need hundreds of classifiers to solve real world classification problems
-
Fernández-Delgado, M., Cernadas, E., Barro, S., Amorim, D., Do we need hundreds of classifiers to solve real world classification problems. Journal of Machine Learning Research 15 (2014), 3133–3181.
-
(2014)
Journal of Machine Learning Research
, vol.15
, pp. 3133-3181
-
-
Fernández-Delgado, M.1
Cernadas, E.2
Barro, S.3
Amorim, D.4
-
10
-
-
0020083498
-
The meaning and use of the area under a receiver operating characteristic (ROC) curve
-
Hanley, J.A., McNeil, B.J., The meaning and use of the area under a receiver operating characteristic (ROC) curve. Radiology 143 (1982), 29–36.
-
(1982)
Radiology
, vol.143
, pp. 29-36
-
-
Hanley, J.A.1
McNeil, B.J.2
-
11
-
-
33751110224
-
Data mining in manufacturing: A review
-
Harding, J.A., Shahbaz, M., Srinivas, S., Kusiak, A., Data mining in manufacturing: A review. Journal of Manufacturing Science and Engineering 128 (2006), 969–976.
-
(2006)
Journal of Manufacturing Science and Engineering
, vol.128
, pp. 969-976
-
-
Harding, J.A.1
Shahbaz, M.2
Srinivas, S.3
Kusiak, A.4
-
12
-
-
84948569647
-
A fuzzy TOPSIS and rough set based approach for mechanism analysis of product infant failure
-
He, Y.-H., Wang, L.-B., He, Z.-Z., Xie, M., A fuzzy TOPSIS and rough set based approach for mechanism analysis of product infant failure. Engineering Applications of Artificial Intelligence 47 (2016), 25–37.
-
(2016)
Engineering Applications of Artificial Intelligence
, vol.47
, pp. 25-37
-
-
He, Y.-H.1
Wang, L.-B.2
He, Z.-Z.3
Xie, M.4
-
13
-
-
78650681551
-
Mining rules from an incomplete dataset with a high missing rate
-
Hong, T.-P., Wu, C.-W., Mining rules from an incomplete dataset with a high missing rate. Expert Systems with Applications 38 (2011), 3931–3936.
-
(2011)
Expert Systems with Applications
, vol.38
, pp. 3931-3936
-
-
Hong, T.-P.1
Wu, C.-W.2
-
14
-
-
84961202780
-
Understanding big consumer opinion data for market-driven product design
-
Jin, J., Liu, Y., Ji, P., Liu, H., Understanding big consumer opinion data for market-driven product design. International Journal of Production Research 54 (2016), 3019–3041.
-
(2016)
International Journal of Production Research
, vol.54
, pp. 3019-3041
-
-
Jin, J.1
Liu, Y.2
Ji, P.3
Liu, H.4
-
15
-
-
85088938629
-
The statistical analysis of failure time data
-
2nd ed. John Wiley & Sons
-
Kalbfleisch, J.D., Prentice, R.L., The statistical analysis of failure time data. 2nd ed., 2011, John Wiley & Sons.
-
(2011)
-
-
Kalbfleisch, J.D.1
Prentice, R.L.2
-
16
-
-
84896498038
-
Approximating support vector machine with artificial neural network for fast prediction
-
Kang, S., Cho, S., Approximating support vector machine with artificial neural network for fast prediction. Expert Systems with Applications 41 (2014), 4989–4995.
-
(2014)
Expert Systems with Applications
, vol.41
, pp. 4989-4995
-
-
Kang, S.1
Cho, S.2
-
17
-
-
84938810638
-
Using wafer map features to better predict die-level failures in final test
-
Kang, S., Cho, S., An, D., Rim, J., Using wafer map features to better predict die-level failures in final test. IEEE Transactions on Semiconductor Manufacturing 28 (2015), 431–437.
-
(2015)
IEEE Transactions on Semiconductor Manufacturing
, vol.28
, pp. 431-437
-
-
Kang, S.1
Cho, S.2
An, D.3
Rim, J.4
-
18
-
-
69249221367
-
A virtual metrology system for semiconductor manufacturing
-
Kang, P., Lee, H.-j., Cho, S., Kim, D., Park, J., Park, C.-K., et al. A virtual metrology system for semiconductor manufacturing. Expert Systems with Applications 36 (2009), 12554–12561.
-
(2009)
Expert Systems with Applications
, vol.36
, pp. 12554-12561
-
-
Kang, P.1
Lee, H.-J.2
Cho, S.3
Kim, D.4
Park, J.5
Park, C.-K.6
-
20
-
-
49149109532
-
An approach for factory-wide control utilizing virtual metrology
-
Khan, A.A., Moyne, J.R., Tilbury, D.M., An approach for factory-wide control utilizing virtual metrology. IEEE Transactions on Semiconductor Manufacturing 20 (2007), 364–375.
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, pp. 364-375
-
-
Khan, A.A.1
Moyne, J.R.2
Tilbury, D.M.3
-
21
-
-
82255179131
-
Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing
-
Kim, D., Kang, P., Cho, S., joo Lee, H., Doh, S., Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing. Expert Systems with Applications 39 (2012), 4075–4083.
-
(2012)
Expert Systems with Applications
, vol.39
, pp. 4075-4083
-
-
Kim, D.1
Kang, P.2
Cho, S.3
joo Lee, H.4
Doh, S.5
-
22
-
-
79957992809
-
A review of data mining applications for quality improvement in manufacturing industry
-
Köksal, G., Batmaz, İ., Testik, M.C., A review of data mining applications for quality improvement in manufacturing industry. Expert Systems with Applications 38 (2011), 13448–13467.
-
(2011)
Expert Systems with Applications
, vol.38
, pp. 13448-13467
-
-
Köksal, G.1
Batmaz, İ.2
Testik, M.C.3
-
23
-
-
33750341424
-
A review of yield modelling techniques for semiconductor manufacturing
-
Kumar, N., Kennedy, K., Gildersleeve, K., Abelson, R., Mastrangelo, C.M., Montgomery, D.C., A review of yield modelling techniques for semiconductor manufacturing. International Journal of Production Research 44 (2006), 5019–5036.
-
(2006)
International Journal of Production Research
, vol.44
, pp. 5019-5036
-
-
Kumar, N.1
Kennedy, K.2
Gildersleeve, K.3
Abelson, R.4
Mastrangelo, C.M.5
Montgomery, D.C.6
-
24
-
-
80255131411
-
A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes
-
Kwak, D.-S., Kim, K.-J., A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes. Expert Systems with Applications 39 (2012), 2590–2596.
-
(2012)
Expert Systems with Applications
, vol.39
, pp. 2590-2596
-
-
Kwak, D.-S.1
Kim, K.-J.2
-
25
-
-
0032394531
-
Statistical analysis of product warranty data
-
Lawless, J.F., Statistical analysis of product warranty data. International Statistical Review 66 (1998), 41–60.
-
(1998)
International Statistical Review
, vol.66
, pp. 41-60
-
-
Lawless, J.F.1
-
26
-
-
84973579538
-
UNISON framework of data-driven innovation for extracting user experience of product design of wearable devices
-
Lin, K.-Y., Chien, C.-F., Kerh, R., UNISON framework of data-driven innovation for extracting user experience of product design of wearable devices. Computers& Industrial Engineering 99 (2016), 487–502.
-
(2016)
Computers& Industrial Engineering
, vol.99
, pp. 487-502
-
-
Lin, K.-Y.1
Chien, C.-F.2
Kerh, R.3
-
27
-
-
34548733647
-
Remaining life estimation of used components in consumer products: Life cycle data analysis by Weibull and artificial neural networks
-
Mazhar, M.I., Kara, S., Kaebernick, H., Remaining life estimation of used components in consumer products: Life cycle data analysis by Weibull and artificial neural networks. Journal of Operations Management 25 (2007), 1184–1193.
-
(2007)
Journal of Operations Management
, vol.25
, pp. 1184-1193
-
-
Mazhar, M.I.1
Kara, S.2
Kaebernick, H.3
-
28
-
-
26944440238
-
A case-based explanation system for black-box systems
-
Nugent, C., Cunningham, P., A case-based explanation system for black-box systems. Artificial Intelligence Review 24 (2005), 163–178.
-
(2005)
Artificial Intelligence Review
, vol.24
, pp. 163-178
-
-
Nugent, C.1
Cunningham, P.2
-
29
-
-
21344489863
-
Defining quality: Alternatives and implications
-
Reeves, C.A., Bednar, D.A., Defining quality: Alternatives and implications. Academy of Management Review 19 (1994), 419–445.
-
(1994)
Academy of Management Review
, vol.19
, pp. 419-445
-
-
Reeves, C.A.1
Bednar, D.A.2
-
30
-
-
0034694469
-
A machine learning approach to yield management in semiconductor manufacturing
-
Shin, C.K., Park, S.C., A machine learning approach to yield management in semiconductor manufacturing. International Journal of Production Research 38 (2000), 4261–4271.
-
(2000)
International Journal of Production Research
, vol.38
, pp. 4261-4271
-
-
Shin, C.K.1
Park, S.C.2
-
31
-
-
56049111065
-
Incorporating domain knowledge into data mining classifiers: An application in indirect lending
-
Sinha, A.P., Zhao, H., Incorporating domain knowledge into data mining classifiers: An application in indirect lending. Decision Support Systems 46 (2008), 287–299.
-
(2008)
Decision Support Systems
, vol.46
, pp. 287-299
-
-
Sinha, A.P.1
Zhao, H.2
-
32
-
-
0036544406
-
Data mining technology for failure prognostic of avionics
-
Skormin, V.A., Gorodetski, V.I., Popyack, L.J., Data mining technology for failure prognostic of avionics. IEEE Transactions on Aerospace and Electronic Systems 38 (2002), 388–403.
-
(2002)
IEEE Transactions on Aerospace and Electronic Systems
, vol.38
, pp. 388-403
-
-
Skormin, V.A.1
Gorodetski, V.I.2
Popyack, L.J.3
-
33
-
-
84941873844
-
A practical approach to data mining: I have all these data; Now what should i do?
-
Snee, R.D., A practical approach to data mining: I have all these data; Now what should i do?. Quality Engineering 27 (2015), 477–487.
-
(2015)
Quality Engineering
, vol.27
, pp. 477-487
-
-
Snee, R.D.1
-
34
-
-
84928227196
-
ARA and ARI imperfect repair models: Estimation, goodness-of-fit and reliability prediction
-
de Toledo, M.L.G., Freitas, M.A., Colosimo, E.A., Gilardoni, G.L., ARA and ARI imperfect repair models: Estimation, goodness-of-fit and reliability prediction. Reliability Engineering & System Safety 140 (2015), 107–115.
-
(2015)
Reliability Engineering & System Safety
, vol.140
, pp. 107-115
-
-
de Toledo, M.L.G.1
Freitas, M.A.2
Colosimo, E.A.3
Gilardoni, G.L.4
-
35
-
-
0037443771
-
A review of process fault detection and diagnosis: Part II: Qualitative models and search strategies
-
Venkatasubramanian, V., Rengaswamy, R., Kavuri, S.N., A review of process fault detection and diagnosis: Part II: Qualitative models and search strategies. Computers & Chemical Engineering 27 (2003), 313–326.
-
(2003)
Computers & Chemical Engineering
, vol.27
, pp. 313-326
-
-
Venkatasubramanian, V.1
Rengaswamy, R.2
Kavuri, S.N.3
-
36
-
-
0037443770
-
A review of process fault detection and diagnosis: Part I: Quantitative model-based methods
-
Venkatasubramanian, V., Rengaswamy, R., Yin, K., Kavuri, S.N., A review of process fault detection and diagnosis: Part I: Quantitative model-based methods. Computers & Chemical Engineering 27 (2003), 293–311.
-
(2003)
Computers & Chemical Engineering
, vol.27
, pp. 293-311
-
-
Venkatasubramanian, V.1
Rengaswamy, R.2
Yin, K.3
Kavuri, S.N.4
-
37
-
-
84949220678
-
Integrated system health management-oriented maintenance decision-making for multi-state system based on data mining
-
Xu, J., Sun, K., Xu, L., Integrated system health management-oriented maintenance decision-making for multi-state system based on data mining. International Journal of Systems Science 47 (2016), 3287–3301.
-
(2016)
International Journal of Systems Science
, vol.47
, pp. 3287-3301
-
-
Xu, J.1
Sun, K.2
Xu, L.3
-
39
-
-
0242666971
-
Data preparation for data mining
-
Zhang, S., Zhang, C., Yang, Q., Data preparation for data mining. Applied Artificial Intelligence 17 (2003), 375–381.
-
(2003)
Applied Artificial Intelligence
, vol.17
, pp. 375-381
-
-
Zhang, S.1
Zhang, C.2
Yang, Q.3
-
40
-
-
0035401598
-
An intelligent data mining system for drop test analysis of electronic products
-
Zhou, C., Nelson, P.C., Xiao, W., Tirpak, T.M., Lane, S.A., An intelligent data mining system for drop test analysis of electronic products. IEEE Transactions on Electronics Packaging Manufacturing 24 (2001), 222–231.
-
(2001)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.24
, pp. 222-231
-
-
Zhou, C.1
Nelson, P.C.2
Xiao, W.3
Tirpak, T.M.4
Lane, S.A.5
|