Static test compaction for IDDQ testing of sequential circuits

Proceeding - 1998 IEEE International Workshop on IDDQ Testing, IDDQ 1998

Volumn 1998-November, Issue , 1998, Pages 9-13

  Higami, Y ^a   Saluja, K K ^b   Kinoshita, K ^c  

^a EHIME UNIVERSITY   (Japan)

^b UNIVERSITY OF WISCONSIN   (United States)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRIP LINES; SEQUENTIAL CIRCUITS; TIMING CIRCUITS;

BRIDGING FAULT; IDDQ TESTING; INTERNAL NODES; SIGNAL LINES; STATIC TEST COMPACTION; TARGET FAULTS;

COMPACTION;

EID: 85011878537     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDDQ.1998.730725     Document Type: Conference Paper

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