Algorithms to select IDDQ measurement points to detect bridging faults

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 8, Issue 3, 1996, Pages 275-285

  Chakravarty, Sreejit ^a   Thadikaran, Paul J ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DEFECTS; FAILURE ANALYSIS; OPTIMIZATION; SET THEORY; VECTORS;

BRIDGING FAULTS; SUBSET SELECTION PROBLEM; TEST SELECTION;

INTEGRATED CIRCUIT TESTING;

EID: 0030166866     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00133389     Document Type: Article

References (22)